Dielectric characterization of materials at microwave frequency range
In this study a coaxial line was used to connect a microwave-frequency Network Analyzer and a base moving sample holder for dielectric characterization of ferroelectric materials in the microwave range. The main innovation of the technique is the introduction of a special sample holder that eliminates the air gap effect by pressing sample using a fine pressure system control. The device was preliminary tested with alumina (Al2O3) ceramics and validated up to 2 GHz. Dielectric measurements of lanthanum and manganese modified lead titanate (PLTM) ceramics were carried out in order to evaluate the technique for a high permittivity material in the microwave range. Results showed that such method is very useful for materials with high dielectric permittivities, which is generally a limiting factor of other techniques in the frequency range from 50 MHz to 2 GHz.
| Main Authors: | , , |
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| Format: | Digital revista |
| Language: | English |
| Published: |
ABM, ABC, ABPol
2003
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| Online Access: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392003000100017 |
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| Summary: | In this study a coaxial line was used to connect a microwave-frequency Network Analyzer and a base moving sample holder for dielectric characterization of ferroelectric materials in the microwave range. The main innovation of the technique is the introduction of a special sample holder that eliminates the air gap effect by pressing sample using a fine pressure system control. The device was preliminary tested with alumina (Al2O3) ceramics and validated up to 2 GHz. Dielectric measurements of lanthanum and manganese modified lead titanate (PLTM) ceramics were carried out in order to evaluate the technique for a high permittivity material in the microwave range. Results showed that such method is very useful for materials with high dielectric permittivities, which is generally a limiting factor of other techniques in the frequency range from 50 MHz to 2 GHz. |
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