ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS
In present work we report the one step electrodeposition of ZnX (X = Se y Te) thin films in acid solution. In order to establish the appropriate conditions for the electrodeposition, a voltammetric and photovoltammetric study on different substrates was previously performed. The films were analyzed by different techniques (SEM, EDS, XRD and optical reflectance). The composition of the ZnTe films was very close to the stoichiometric one, instead, ZnSe films presented a selenium excess that can be eliminated with a proper annealing. Optical reflectance characterization of ZnSe and ZnTe samples grown on titanium gave direct band gaps values of 2.64 eV and 2.27 eV, respectively, in agreement with those reported in the bibliography.
Saved in:
| Main Authors: | , , , , , , |
|---|---|
| Format: | Digital revista |
| Language: | English |
| Published: |
Sociedad Chilena de Química
2002
|
| Online Access: | http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0366-16442002000400013 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | In present work we report the one step electrodeposition of ZnX (X = Se y Te) thin films in acid solution. In order to establish the appropriate conditions for the electrodeposition, a voltammetric and photovoltammetric study on different substrates was previously performed. The films were analyzed by different techniques (SEM, EDS, XRD and optical reflectance). The composition of the ZnTe films was very close to the stoichiometric one, instead, ZnSe films presented a selenium excess that can be eliminated with a proper annealing. Optical reflectance characterization of ZnSe and ZnTe samples grown on titanium gave direct band gaps values of 2.64 eV and 2.27 eV, respectively, in agreement with those reported in the bibliography. |
|---|