Are scenario projections overly optimistic about future yield progress?

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Bibliographic Details
Main Authors: van Zeist, Willem-Jan, Stehfest, Elke, Doelman, Jonathan C., Valin, Hugo, Calvin, Katherine, Sulser, Timothy B., Wiebe, Keith D.
Published: 2024-05-22T12:10:44Z
Online Access:https://hdl.handle.net/10568/142600
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