Genome-wide association study for resistance to tan spot in synthetic hexaploid wheat

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Bibliographic Details
Main Authors: Lozano Ramirez, Nerida, Dreisigacker, Susanne, Sansaloni, Carolina P., Xinyao He, Sandoval-Islas, Sergio, Pérez Rodriguez, Paulino, Carballo-Carballo, Aquiles, Nava Díaz, Cristian, Kishii, Masahiro, Singh, Pawan K.
Published: 2023-01-03T14:13:03Z
Online Access:https://hdl.handle.net/10568/126501
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