Structural quality in single crystalline CdSe ingots grown by PVT

ABSTRACT CdSe is II-VI semiconductor with compact hexagonal structure. It has a band gap of 1.82 eV and a high stopping power for nuclear radiation. Single crystalline CdSe ingots were grown by Physical Vapor Transport (PVT) employing a horizontal reactor. As devices critically depend on material properties its single crystalline quality was determined by chemical etching and transmission electron microscopy. Results were compared to those corresponding to Bridgman High Pressure (HPB) grown material and also to PVT material grown in a vertical reactor.

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Bibliographic Details
Main Authors: D´Elía,Raúl Luis, Aguirre,Myriam Haydée, Stéfano,María Cristina Di, Heredia,Eduardo Armando, Martínez,Ana María, Cánepa,Horacio Ricardo, García,Javier Luis Mariano Núñez, Trigubó,Alicia Beatriz
Format: Digital revista
Language:English
Published: Laboratório de Hidrogênio, Coppe - Universidade Federal do Rio de Janeiro 2020
Online Access:http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1517-70762020000100339
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