Electrochemical Characterization of the Influence of Scanning Number on the Self-assembled Monolayer Formed by Schiff Base
The influence of potential-scan number on the Schiff base self-assembled monolayer was probed by the Cyclic Voltammetry (CV) and Electrochemical Impedance Spectroscopy (EIS) techniques for the first time. The results showed that the charge transferring resistance (Rct) could be reduced with the potential-scan, suggesting that the structure of the self-assembled monolayer was altered. Also, the relationship between the content of C=N group, represented approximately by the reduction electric charge (Qr), and the monolayers packing degree which was represented by the value of Rct, was described. Providing a new way to change the interface characterization is the main contribution of this paper.
Saved in:
| Main Authors: | , , , , |
|---|---|
| Format: | Digital revista |
| Language: | English |
| Published: |
Sociedade Portuguesa de Electroquímica
2003
|
| Online Access: | http://scielo.pt/scielo.php?script=sci_arttext&pid=S0872-19042003000300003 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|