Positive and Negative Affect Schedule (PANAS): psychometric properties of a Venezuelan Spanish version in medical students.

Abstract: The study of affect covers a wide range of interests in psychiatry and psychology. The PANAS (positive and negative affect scale) is widely used to explore and monitor affect. In this study, the psychometric features of an online, Spanish version of the PANAS in Venezuela are described. The PANAS comprises 10 items exploring positive (PA) and 10 exploring negative (NA) pointers of affect. After back translation and content validity by expert opinion, the scale was administered to a probabilistic sample of 100, fifth-year medical students. We assessed factor and internal consistency analysis, 15-day apart test-retest, and concurrent validity with locally validated scales of depression (GE-DEPRE) and anxiety (ANSILET), and the Ryff's scale of psychological well-being (PWB). The PANAS displayed good content validity (validity ratio = 0.91) and internal consistency (Crochan alfa, PA = 0.89, NA = 0.88). A forced factor analysis produced two, 10-item components of PA and NA each. The PANAS behaved poorly in the test-retest analysis, with marginally significant correlation in the PA dimension only (p = 0.055). The NA subscale positively correlated with the ANSILET scale (p = 0.03) and negatively with the PWB scale (p = 0.049). The PA only showed marginal convergent validity with the "personal relations" dimension of the PWB scale. We confirmed the two dimensions of the PANAS. Its inconsistent repeatability and construct validity support the definition of this scale as a dynamic instrument, relatively independent from depression and anxiety dimensions, and with specific value for monitoring elemental components of affect.

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Bibliographic Details
Main Authors: Baptista,Trino, Vargas,Olga, Colmenares,Rosani, Piñero,Javier
Format: Digital revista
Language:English
Published: Instituto de Investigaciones Clínicas "Dr. Américo Negrette", Facultad de Medicina, Universidad del Zulia 2020
Online Access:http://ve.scielo.org/scielo.php?script=sci_arttext&pid=S0535-51332020000400301
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