Scanning electron microscopy and X-ray spectroscopy applied to mycelial phase of sporothrix schenckii
Scanning electron microscopy applied to the mycelial phase of Sporothrix schenckii shows a matted mycelium with conidia of a regular pattern. X-Ray microanalysis applied in energy dispersive spectroscopy and also in wavelength dispersive spectroscopy reveals the presence of several elements of Mendeleef's classification.
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| Main Authors: | , |
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| Format: | Digital revista |
| Language: | English |
| Published: |
Sociedade Brasileira de Medicina Tropical - SBMT
1975
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| Online Access: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0037-86821975000200001 |
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