XPS, DRUV-VIS and ESR characterization of the non-stoichiometric compound Ge0.74V0.21 □0.05O2
Abstract Microcrystalline powders of the nonstoichiometric Ge0.74V0.21 □0.05O2 compound were prepared by conventional high temperature solid-state reactions. The powders were characterized by X-ray diffraction (XRD); scanning electron microscopy (SEM); X-ray photoelectron spectroscopy (XPS); diffuse reflectance ultraviolet-visible spectroscopy (DRUV-VIS) and electron spin resonance (ESR) spectroscopy. From the analysis performed on compound, it was found that: The powders showed a rutile type crystalline structure with a rectangular prismatic crystalline habit. The XPS analysis, confirm the presence of V4+ and V5+ vanadium ions, the DRUV-VIS spectra show absorption bands in the 200-800 nm wave length interval and the ESR analysis confirms that the V4+ ions are within microcrystals, hosted as VO2+ at sites of rhombic (C 2v ) symmetry.
| Main Authors: | , , , , |
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| Format: | Digital revista |
| Language: | English |
| Published: |
Sociedad Mexicana de Física
2017
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| Online Access: | http://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2017000200166 |
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