Near-field microscopy of evanescent microwaves
Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilities of the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane) scattering were elucidated. A set of two-dimensional mirrors for a local control of evanescent modes are shown along with their corresponding near-field image, and their efficiency is discussed. We believe that the experimental approach used is reliable enough to be used as a check of potential (two-dimensional) micro-components and possibly for micro and nano-circuits.
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| Main Authors: | , , , , |
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| Format: | Digital revista |
| Language: | English |
| Published: |
Sociedad Mexicana de Física
2005
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| Online Access: | http://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2005000400013 |
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