Implications of Very Deep Super-Resolution (VDSR) on RGB imagery for grain yield assessment in wheat
4 Pág.
Saved in:
| Main Authors: | , , , , |
|---|---|
| Other Authors: | |
| Format: | comunicación de congreso biblioteca |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers
2020-11-23
|
| Subjects: | Deep learning, Digital image processing, Grain yield, RGB imagery, Wheat, |
| Online Access: | http://hdl.handle.net/10261/337568 https://api.elsevier.com/content/abstract/scopus_id/85115950340 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|