RFI Analysis in SMOS Imagery

2010 IEEE International Geoscience and Remote Sensing Symposium (IGARSS), 25-30 July 2010, Honolulu, HI.-- 4 pages, 9 figures

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Bibliographic Details
Main Authors: Camps, Adriano, Gourrion, Jérôme, Tarongí, José Miguel, Gutiérrez, Antonio, Barbosa, José, Castro, Rita
Format: capítulo de libro biblioteca
Published: Institute of Electrical and Electronics Engineers 2010
Subjects:RFI, SMOS, Probability of detection, Probability of false alarm,
Online Access:http://hdl.handle.net/10261/101685
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