Genome-wide association mapping indicates quantitative genetic control of spot blotch resistance in bread wheat and the favorable effects of some spot blotch loci on grain yield

Genome-wide association mapping indicates quantitative genetic control of spot blotch resistance in bread wheat and the favorable effects of some spot blotch loci on grain yield

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Bibliographic Details
Main Authors: Juliana, Philomin, Xinyao He, Poland, Jesse A., Shrestha, Sandesh, Joshi, Arun Kumar, Huerta Espino, Julio, Velu, Govindan, Crespo-Herrera, Leonardo A., Mondal, Suchismita, Kumar, Uttam, Bhati, Pradeep, Vishwakarma, Manish Kumar, Singh, Ravi P., Singh, Pawan K.
Published: 2023-01-04T10:21:47Z
Online Access:https://hdl.handle.net/10568/126541
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https://hdl.handle.net/10568/126541

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