High-density deletion bin map of wheat D genome
A NimbleGen array containing both gene-based and RJM repeat junction probe sequences derived from Ae. Tauschii was developed and used to map the Chinese Spring nullisomic-tetrasomic lines and deletion bin lines of the D genome chromosomes. Overall design: The NimbleGen array was hybridized in duplicate with Cy3 labeled seven nullisomic-tetrasomic lines, deletion bin lines for D genome chromosomes, and control reference Chinese Spring; as well as Cy5 labeled reference line Chinese Spring.
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| Main Author: | |
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| Format: | Dataset biblioteca |
| Published: |
2015
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| Subjects: | Genetics, Aegilops tauschii, eEukaryotes, |
| Online Access: | https://figshare.com/articles/dataset/High-density_deletion_bin_map_of_wheat_D_genome/25080437 |
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