Replication Data for: Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines

A large-scale genome-wide association study was carried out to dissect the genetic architecture of wheat grain yield potential and stress-resilience. Based on the findings, grain yield-associated marker profiles were generated for a large panel of 73,142 wheat lines and the grain-yield favorable allele frequencies were also determined. The marker profile data are presented in this dataset.

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Bibliographic Details
Main Authors: Juliana, Philomin, Singh, Ravi, Poland, Jesse, Shrestha, Sandesh, Huerta Espino, Julio, Govindan, Velu, Mondal, Suchismita, Crespo Herrera, Leonardo Abdiel, Kumar, Uttam, Joshi, Arun Kumar, Payne, Thomas, Bhati, Pradeep Kumar, Tomar, Vipin, Consolacion, Franjel, Campos Serna, Jaime Amador
Other Authors: Dreher, Kate
Format: Genotypic data biblioteca
Language:English
Published: CIMMYT Research Data & Software Repository Network 2021
Subjects:Agricultural Sciences, Wheat, Triticum aestivum, Grain yield, Agricultural research, Genotypes,
Online Access:https://hdl.handle.net/11529/10548546
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