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Field-Ion Microscopy [electronic resource] /
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| Main Authors: | , , |
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| Format: | Texto biblioteca |
| Language: | eng |
| Published: |
Boston, MA : Springer US : Imprint: Springer,
1968
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| Subjects: | Materials science., Materials Science., Characterization and Evaluation of Materials., |
| Online Access: | http://dx.doi.org/10.1007/978-1-4899-6513-4 |
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| id |
KOHA-OAI-TEST:232101 |
|---|---|
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koha |
| spelling |
KOHA-OAI-TEST:2321012018-07-31T00:15:56ZField-Ion Microscopy [electronic resource] / Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) textBoston, MA : Springer US : Imprint: Springer,1968.engMaterials science.Materials Science.Characterization and Evaluation of Materials.Springer eBookshttp://dx.doi.org/10.1007/978-1-4899-6513-4URN:ISBN:9781489965134 |
| institution |
COLPOS |
| collection |
Koha |
| country |
México |
| countrycode |
MX |
| component |
Bibliográfico |
| access |
En linea En linea |
| databasecode |
cat-colpos |
| tag |
biblioteca |
| region |
America del Norte |
| libraryname |
Departamento de documentación y biblioteca de COLPOS |
| language |
eng |
| topic |
Materials science. Materials Science. Characterization and Evaluation of Materials. Materials science. Materials Science. Characterization and Evaluation of Materials. |
| spellingShingle |
Materials science. Materials Science. Characterization and Evaluation of Materials. Materials science. Materials Science. Characterization and Evaluation of Materials. Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) Field-Ion Microscopy [electronic resource] / |
| format |
Texto |
| topic_facet |
Materials science. Materials Science. Characterization and Evaluation of Materials. |
| author |
Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) |
| author_facet |
Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) |
| author_sort |
Hren, John J. editor. |
| title |
Field-Ion Microscopy [electronic resource] / |
| title_short |
Field-Ion Microscopy [electronic resource] / |
| title_full |
Field-Ion Microscopy [electronic resource] / |
| title_fullStr |
Field-Ion Microscopy [electronic resource] / |
| title_full_unstemmed |
Field-Ion Microscopy [electronic resource] / |
| title_sort |
field-ion microscopy [electronic resource] / |
| publisher |
Boston, MA : Springer US : Imprint: Springer, |
| publishDate |
1968 |
| url |
http://dx.doi.org/10.1007/978-1-4899-6513-4 |
| work_keys_str_mv |
AT hrenjohnjeditor fieldionmicroscopyelectronicresource AT ranganathanseditor fieldionmicroscopyelectronicresource AT springerlinkonlineservice fieldionmicroscopyelectronicresource |
| _version_ |
1756271756840009728 |