Field-Ion Microscopy [electronic resource] /
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Format: | Texto biblioteca |
Language: | eng |
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Boston, MA : Springer US : Imprint: Springer,
1968
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Subjects: | Materials science., Materials Science., Characterization and Evaluation of Materials., |
Online Access: | http://dx.doi.org/10.1007/978-1-4899-6513-4 |
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KOHA-OAI-TEST:2321012018-07-31T00:15:56ZField-Ion Microscopy [electronic resource] / Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) textBoston, MA : Springer US : Imprint: Springer,1968.engMaterials science.Materials Science.Characterization and Evaluation of Materials.Springer eBookshttp://dx.doi.org/10.1007/978-1-4899-6513-4URN:ISBN:9781489965134 |
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México |
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MX |
component |
Bibliográfico |
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En linea En linea |
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biblioteca |
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America del Norte |
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Departamento de documentación y biblioteca de COLPOS |
language |
eng |
topic |
Materials science. Materials Science. Characterization and Evaluation of Materials. Materials science. Materials Science. Characterization and Evaluation of Materials. |
spellingShingle |
Materials science. Materials Science. Characterization and Evaluation of Materials. Materials science. Materials Science. Characterization and Evaluation of Materials. Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) Field-Ion Microscopy [electronic resource] / |
format |
Texto |
topic_facet |
Materials science. Materials Science. Characterization and Evaluation of Materials. |
author |
Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) |
author_facet |
Hren, John J. editor. Ranganathan, S. editor. SpringerLink (Online service) |
author_sort |
Hren, John J. editor. |
title |
Field-Ion Microscopy [electronic resource] / |
title_short |
Field-Ion Microscopy [electronic resource] / |
title_full |
Field-Ion Microscopy [electronic resource] / |
title_fullStr |
Field-Ion Microscopy [electronic resource] / |
title_full_unstemmed |
Field-Ion Microscopy [electronic resource] / |
title_sort |
field-ion microscopy [electronic resource] / |
publisher |
Boston, MA : Springer US : Imprint: Springer, |
publishDate |
1968 |
url |
http://dx.doi.org/10.1007/978-1-4899-6513-4 |
work_keys_str_mv |
AT hrenjohnjeditor fieldionmicroscopyelectronicresource AT ranganathanseditor fieldionmicroscopyelectronicresource AT springerlinkonlineservice fieldionmicroscopyelectronicresource |
_version_ |
1756271756840009728 |