Field-Ion Microscopy [electronic resource] /

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Bibliographic Details
Main Authors: Hren, John J. editor., Ranganathan, S. editor., SpringerLink (Online service)
Format: Texto biblioteca
Language:eng
Published: Boston, MA : Springer US : Imprint: Springer, 1968
Subjects:Materials science., Materials Science., Characterization and Evaluation of Materials.,
Online Access:http://dx.doi.org/10.1007/978-1-4899-6513-4
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