![Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse [electronic resource] /](/search/themes/bootstrap3/images/libros.png)
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse [electronic resource] /
X-Ray Optics -- Electron Probe Microanalysis. Physical Bases -- Electron Probe Microanalysis. Quantitative Analysis -- Instrumentation -- Microdiffraction -- Metallurgical and Mineralogical Applications -- Biological Applications.
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| Main Authors: | , , |
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| Format: | Texto biblioteca |
| Language: | ger |
| Published: |
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,
1969
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| Subjects: | Physics., Quantum optics., Quantum Optics., |
| Online Access: | http://dx.doi.org/10.1007/978-3-662-24778-5 |
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