International Workshop on Superconducting Nano-Electronics Devices [electronic resource] : SNED Proceedings, Naples, Italy, May 28–June 1, 2001 /

Quantum Nondemolition Measurements of a Qubit -- Bayesian Quantum Measurement of a Single-Cooper-Pair Qubit -- 1/f Noise in Josephson Qubits -- Switching Currents and Quasi-Particle Poisoning in the Superconducting Single Electron Transistor -- Josephson Systems for Quantum Coherence Experiments -- Solid State Analogue of Double Slit Interferometer -- Noise and Microwave Properties of SET-Transistors -- Use of Small Tunnel Junctions Operating at T = 0.3 K -- A Hysteric Single Cooper Pair Transistor for Single Shot Reading of a Charge-Qubit -- Single Cooper Pair Electrometer Based on a Radio-Frequency-SQUID Scheme -- Possibility of Single-Electron Devices and Superconducting Coherence -- Frequency-Locked Current of Cooper Pairs in Superconducting Single Electron Transistor with Ohmic Resistor -- Setup for Experiments on the Supercurrent-Phase Relation in Bloch Transistors-Status and Possible Applications -- Single-Electron Transistors in the Regime of High Conductance -- Superconducting Transistor-Edge Sensors for Time & Energy Resolved Single-Photon Counters and for Dark Matter Searches -- Optimization of the Hot-Electron Bolometer and a Cascade Quasiparticle -- Noise in Refrigerating Tunnel Junctions and in Microbolometers -- Nonequilibrium Quasiparticles and Electron Cooling by Normal Metal-Superconductor Tunnel Junctions -- Mesoscopic Josephson Junctions Coupled to Weak Coherent Fields: An Example of Reciprocal Detection -- Dynamics of Superconducting Interferometers Containing Pi-Junctions -- Superconducting Current-Phase Dependence on High-Tc Symmetrical Bicrystal Junctions -- Superconducting Quantum Detector for Astronomy and X-Ray Spectroscopy -- Lifetime of Even-Parity States of a Bloch Transistor -- Magnetic Field Dependence of Retrapping Currents in DC-SQUIDs -- Josephson versus Kondo Coupling at a Quantum Dot with Superconducting Contacts.

Bibliographic Details

Main Authors:	Pekola, Jukka. editor., Ruggiero, Berardo. editor., Silvestrini, Paolo. editor., SpringerLink (Online service)
Format:	Texto biblioteca
Language:	eng
Published:	Boston, MA : Springer US : Imprint: Springer, 2002
Subjects:	Physics., Optics., Electrodynamics., Engineering., Electronics., Microelectronics., Optical materials., Electronic materials., Materials science., Optics and Electrodynamics., Electronics and Microelectronics, Instrumentation., Physics, general., Engineering, general., Characterization and Evaluation of Materials., Optical and Electronic Materials.,
Online Access:	http://dx.doi.org/10.1007/978-1-4615-0737-6
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