Secondary Ion Mass Spectrometry SIMS II [electronic resource] : Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979 /

I. Fundamentals Chairpersons: D.E. Harrison and C.A. Evans, Jr. -- II. Quantitation Chairpersons: D.B. Wittry and P. Williams -- III. Semiconductors Chairpersons: C.W. Magee and W. Werner -- IV. Static SIMS Chairperson: A. Benninghoven -- V. Metallurgy Chairpersons: J.D. Brown and A.P. von Rosenstiel -- VI. Instrumentation Chairpersons: D.S. Simons and F.G. Rüdenauer -- VII. Geology Chairpersons: J. Okano and C. Meyer -- VIII. Panel Discussion Chairperson: I.L. Kofsky -- IX. Biology Chairpersons: M.S. Burns and G.H. Morrison -- X. Combined Techniques Chairpersons: C. Johnson and W.H. Christie -- XI. Postdeadline Papers -- Index of Authors.

Bibliographic Details

Main Authors:	Benninghoven, A. editor., Evans, C. A. editor., Powell, R. A. editor., Shimizu, R. editor., Storms, H. A. editor., SpringerLink (Online service)
Format:	Texto biblioteca
Language:	eng
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg, 1979
Subjects:	Chemistry., Mass spectrometry., Physics., Mass Spectrometry., Physics, general.,
Online Access:	http://dx.doi.org/10.1007/978-3-642-61871-0
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