Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] /

This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.

Bibliographic Details

Main Authors:	Fultz, Brent. author., Howe, James M. author., SpringerLink (Online service)
Format:	Texto biblioteca
Language:	eng
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2001
Subjects:	Physics., Solid state physics., Surfaces (Physics)., Interfaces (Physical sciences)., Thin films., Spectroscopy., Microscopy., Materials, Spectroscopy and Microscopy., Surface and Interface Science, Thin Films., Solid State Physics., Surfaces and Interfaces, Thin Films.,
Online Access:	http://dx.doi.org/10.1007/978-3-662-04516-9
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