X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons Libro electrónico
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
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| Main Authors: | , |
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| Format: | Texto biblioteca |
| Language: | eng |
| Published: |
New York, New York, United States Springer-Verlag
c199
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| Subjects: | X-ray crystallography, X-rays, |
| Online Access: | http://link.springer.com/openurl?genre=book&isbn=978-3-642-74804-2 |
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