Accuracy in trace analysis: sampling, sample handling, analysis; proceedings of the 7. Materials Research Symposium - v. 1-2

Accuracy in trace analysis: sampling, sample handling, analysis; proceedings of the 7. Materials Research Symposium - v. 1-2

Diagrs., illus. (some col.), tables. Includes bibliographies. Summaries (En); For sale by: U.S. Govt. Printing Office, Washington, D.C. 20402 (USA)

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Bibliographic Details
Main Authors: LaFleur, P.D. (ed.), National Bureau of Standards, Gaithersburg, Md. (USA). Inst. for Materials Research eng 408535, Materials Research Symp eng 7 Oct 1974 7 Gaithersburg, Md. (USA)
Format: Texto biblioteca
Language:
Published: Gaithersburg, Md. (USA) U.S. Dept. of Commerce, NBS 1976
Subjects:SAMPLING, ANALYTICAL METHODS, TRACE ELEMENTS, ECHANTILLONNAGE, TECHNIQUE ANALYTIQUE, OLIGOELEMENT, MUESTREO, TECNICAS ANALITICAS, OLIGOELEMENTOS,
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