Low-cost assessment of grain yield in durum wheat using RGB images

Low-cost assessment of grain yield in durum wheat using RGB images

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Bibliographic Details
Main Authors: Fernandez-Gallego, J. A., Kefauver, Shawn C., Vatter, Thomas, Aparicio, Nieves, Nieto-Taladriz, María Teresa, Araus, José Luis
Other Authors: CSIC - Instituto Nacional de Investigación y Tecnología Agraria y Alimentaria (INIA)
Format: artículo biblioteca
Language:English
Published: Elsevier 2019-04
Subjects:Abiotic stresses, Digital image processing, Durum wheat, Grain yield, Heritability, Low-cost phenotyping, NDVI, RGB indices,
Online Access:http://hdl.handle.net/10261/370644
https://api.elsevier.com/content/abstract/scopus_id/85062281890
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