Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films

Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films

Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films.

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Main Authors: Bacichetti Junior,Antonio Leondino, Lente,Manuel Henrique, Mendes,Ricardo Gonçalves, Paulin Filho,Pedro Iris, Eiras,José Antonio
Format: Digital revista
Language:English
Published: ABM, ABC, ABPol 2004
Online Access:http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392004000200025
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spelling oai:scielo:S1516-143920040002000252004-06-29Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin filmsBacichetti Junior,Antonio LeondinoLente,Manuel HenriqueMendes,Ricardo GonçalvesPaulin Filho,Pedro IrisEiras,José Antonio Thin films PZT ferroelectrics crystallization Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films.info:eu-repo/semantics/openAccessABM, ABC, ABPolMaterials Research v.7 n.2 20042004-06-01info:eu-repo/semantics/articletext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392004000200025en10.1590/S1516-14392004000200025
institution SCIELO
collection OJS
country Brasil
countrycode BR
component Revista
access En linea
databasecode rev-scielo-br
tag revista
region America del Sur
libraryname SciELO
language English
format Digital
author Bacichetti Junior,Antonio Leondino
Lente,Manuel Henrique
Mendes,Ricardo Gonçalves
Paulin Filho,Pedro Iris
Eiras,José Antonio
spellingShingle Bacichetti Junior,Antonio Leondino
Lente,Manuel Henrique
Mendes,Ricardo Gonçalves
Paulin Filho,Pedro Iris
Eiras,José Antonio
Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films
author_facet Bacichetti Junior,Antonio Leondino
Lente,Manuel Henrique
Mendes,Ricardo Gonçalves
Paulin Filho,Pedro Iris
Eiras,José Antonio
author_sort Bacichetti Junior,Antonio Leondino
title Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films
title_short Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films
title_full Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films
title_fullStr Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films
title_full_unstemmed Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films
title_sort influence of the crystallization thermal treatment on the structural and electrical properties of pzt thin films
description Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films.
publisher ABM, ABC, ABPol
publishDate 2004
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392004000200025
work_keys_str_mv AT bacichettijuniorantonioleondino influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms
AT lentemanuelhenrique influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms
AT mendesricardogoncalves influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms
AT paulinfilhopedroiris influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms
AT eirasjoseantonio influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms
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