Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films
Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films.
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ABM, ABC, ABPol
2004
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oai:scielo:S1516-143920040002000252004-06-29Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin filmsBacichetti Junior,Antonio LeondinoLente,Manuel HenriqueMendes,Ricardo GonçalvesPaulin Filho,Pedro IrisEiras,José Antonio Thin films PZT ferroelectrics crystallization Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films.info:eu-repo/semantics/openAccessABM, ABC, ABPolMaterials Research v.7 n.2 20042004-06-01info:eu-repo/semantics/articletext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392004000200025en10.1590/S1516-14392004000200025 |
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Bacichetti Junior,Antonio Leondino Lente,Manuel Henrique Mendes,Ricardo Gonçalves Paulin Filho,Pedro Iris Eiras,José Antonio |
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Bacichetti Junior,Antonio Leondino Lente,Manuel Henrique Mendes,Ricardo Gonçalves Paulin Filho,Pedro Iris Eiras,José Antonio Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films |
author_facet |
Bacichetti Junior,Antonio Leondino Lente,Manuel Henrique Mendes,Ricardo Gonçalves Paulin Filho,Pedro Iris Eiras,José Antonio |
author_sort |
Bacichetti Junior,Antonio Leondino |
title |
Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films |
title_short |
Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films |
title_full |
Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films |
title_fullStr |
Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films |
title_full_unstemmed |
Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films |
title_sort |
influence of the crystallization thermal treatment on the structural and electrical properties of pzt thin films |
description |
Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films. |
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ABM, ABC, ABPol |
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2004 |
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http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392004000200025 |
work_keys_str_mv |
AT bacichettijuniorantonioleondino influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms AT lentemanuelhenrique influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms AT mendesricardogoncalves influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms AT paulinfilhopedroiris influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms AT eirasjoseantonio influenceofthecrystallizationthermaltreatmentonthestructuralandelectricalpropertiesofpztthinfilms |
_version_ |
1756420296876752896 |