Damage assessment and economic injury level of the two-spotted spider mite Tetranychus urticae in soybean

Abstract: The objective of this work was to quantify the reduction of soybean grain yield caused by Tetranychus urticae damage, and to propose an economic injury level (EIL) for this pest in the crop. The experimental design was set up in randomized complete blocks, with four replicates and a 4x2 factorial arrangement with four levels of mite infestation, with or without mite control. Chlorotic symptoms were evaluated using a damage scale of 1 to 4. Soybean grain yield, number of pods, number of grains, and 1,000-grain weight were quantified for each segment of plant canopy (lower, middle, and upper) and for the whole plants. The chlorophyll content in the leaves was evaluated using the SPAD index. The population density of one two-spotted spider mite per cm2 of leaf area caused the following reductions: one pod per plant, two grains per plant, 0.7 g of 1,000-grain weight, and 0.35 g of grain yield per plant or 42 kg ha-1. Based on the equation y = 4,369 - 41.99x, the EIL of one two-spotted spider mite per cm2 is determined by considering a control cost of US$ 20.00 ha-1 and a soybean crop value of US$ 350.00 Mg-1. As to chlorotic symptoms, the EIL is set between damage scores 1 (no apparent mite damage) and 2 (yellow mottling beginning to appear).

Bibliographic Details

Main Authors:	Padilha,Guilherme, Fiorin,Rubens Alex, Cargnelutti Filho,Alberto, Pozebon,Henrique, Rogers,John, Marques,Rafael Paz, Castilhos,Lauren Brondani, Donatti,Alessandro, Stefanelo,Lucas, Burtet,Leonardo Moreira, Stacke,Regis Felipe, Guedes,Jerson Vanderlei Carús, Arnemann,Jonas André
Format:	Digital revista
Language:	English
Published:	Embrapa Secretaria de Pesquisa e Desenvolvimento 2020
Online Access:	http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0100-204X2020000102001
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