Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance

Abstract In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the Surface Plasmon Resonance (SPR) at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and Δ.

Saved in:
Bibliographic Details
Main Authors: Sánchez-Hernández,H. H., Pérez-Abarca,J. M., Santiago-Alvarado,A., Cruz-Félix,A. S.
Format: Digital revista
Language:English
Published: Sociedad Mexicana de Física 2022
Online Access:http://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2022000300018
Tags: Add Tag
No Tags, Be the first to tag this record!
id oai:scielo:S0035-001X2022000300018
record_format ojs
spelling oai:scielo:S0035-001X20220003000182023-04-10Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonanceSánchez-Hernández,H. H.Pérez-Abarca,J. M.Santiago-Alvarado,A.Cruz-Félix,A. S. Surface plasmon polarization ellipsometry film thickness Abstract In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the Surface Plasmon Resonance (SPR) at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and Δ.info:eu-repo/semantics/openAccessSociedad Mexicana de FísicaRevista mexicana de física v.68 n.3 20222022-06-01info:eu-repo/semantics/articletext/htmlhttp://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2022000300018en10.31349/revmexfis.68.031304
institution SCIELO
collection OJS
country México
countrycode MX
component Revista
access En linea
databasecode rev-scielo-mx
tag revista
region America del Norte
libraryname SciELO
language English
format Digital
author Sánchez-Hernández,H. H.
Pérez-Abarca,J. M.
Santiago-Alvarado,A.
Cruz-Félix,A. S.
spellingShingle Sánchez-Hernández,H. H.
Pérez-Abarca,J. M.
Santiago-Alvarado,A.
Cruz-Félix,A. S.
Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
author_facet Sánchez-Hernández,H. H.
Pérez-Abarca,J. M.
Santiago-Alvarado,A.
Cruz-Félix,A. S.
author_sort Sánchez-Hernández,H. H.
title Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
title_short Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
title_full Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
title_fullStr Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
title_full_unstemmed Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
title_sort amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
description Abstract In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the Surface Plasmon Resonance (SPR) at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and Δ.
publisher Sociedad Mexicana de Física
publishDate 2022
url http://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2022000300018
work_keys_str_mv AT sanchezhernandezhh amplitudeandphasemeasumentusingreflectionpolarizationmodeofaprismbasedsurfaceplasmonresonance
AT perezabarcajm amplitudeandphasemeasumentusingreflectionpolarizationmodeofaprismbasedsurfaceplasmonresonance
AT santiagoalvaradoa amplitudeandphasemeasumentusingreflectionpolarizationmodeofaprismbasedsurfaceplasmonresonance
AT cruzfelixas amplitudeandphasemeasumentusingreflectionpolarizationmodeofaprismbasedsurfaceplasmonresonance
_version_ 1764986501990449152