On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
The Aethalometer (AE; Magee Scientific) is a widely used filter-based instrument that provides in-situ realtime optical measurements of light absorbing aerosols in 7 different wavelengths ranging from 370nm to 950nm. As for any other filter-based technique, Aethalometer measurements are affected by two artefacts: the multiple-scattering effects caused by the scattering of sampling light by both the filter fibres and the aerosol particles on the filter (C(l) in Eq. 1) and the loading effect due to the saturation of the measurement as a function of deposited particles (RATN(l) in Eq. 1).
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Format: | comunicación de congreso biblioteca |
Language: | English |
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2020-09
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Subjects: | Aerosols, Aethalometer, |
Online Access: | http://hdl.handle.net/10261/217670 |
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dig-idaea-es-10261-2176702022-02-04T09:01:51Z On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C Yus-Díez, Jesús Bernardoni, V. Pandolfi, Marco Alastuey, Andrés Querol, Xavier Ciniglia, Davide Močnik, G. Vecchi, R. Pandolfi, Marco [0000-0002-7493-7213] Alastuey, Andrés [0000-0002-5453-5495] Querol, Xavier [0000-0002-6549-9899] Aerosols Aethalometer The Aethalometer (AE; Magee Scientific) is a widely used filter-based instrument that provides in-situ realtime optical measurements of light absorbing aerosols in 7 different wavelengths ranging from 370nm to 950nm. As for any other filter-based technique, Aethalometer measurements are affected by two artefacts: the multiple-scattering effects caused by the scattering of sampling light by both the filter fibres and the aerosol particles on the filter (C(l) in Eq. 1) and the loading effect due to the saturation of the measurement as a function of deposited particles (RATN(l) in Eq. 1). This work was supported by Generalitat de Catalunya (SGR41), FEDER funds under the project HOUSE (CGL2016-78594-R), COST action COLOSSAL (CA16109). Peer reviewed 2020-08-10T10:20:03Z 2020-08-10T10:20:03Z 2020-09 comunicación de congreso http://purl.org/coar/resource_type/c_5794 European Aerosol Conference (EAC) 2020 http://hdl.handle.net/10261/217670 en Sí open |
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Aerosols Aethalometer Aerosols Aethalometer |
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Aerosols Aethalometer Aerosols Aethalometer Yus-Díez, Jesús Bernardoni, V. Pandolfi, Marco Alastuey, Andrés Querol, Xavier Ciniglia, Davide Močnik, G. Vecchi, R. On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C |
description |
The Aethalometer (AE; Magee Scientific) is a widely
used filter-based instrument that provides in-situ realtime
optical measurements of light absorbing aerosols
in 7 different wavelengths ranging from 370nm to
950nm. As for any other filter-based technique,
Aethalometer measurements are affected by two
artefacts: the multiple-scattering effects caused by the
scattering of sampling light by both the filter fibres and
the aerosol particles on the filter (C(l) in Eq. 1) and the
loading effect due to the saturation of the
measurement as a function of deposited particles
(RATN(l) in Eq. 1). |
author2 |
Pandolfi, Marco [0000-0002-7493-7213] |
author_facet |
Pandolfi, Marco [0000-0002-7493-7213] Yus-Díez, Jesús Bernardoni, V. Pandolfi, Marco Alastuey, Andrés Querol, Xavier Ciniglia, Davide Močnik, G. Vecchi, R. |
format |
comunicación de congreso |
topic_facet |
Aerosols Aethalometer |
author |
Yus-Díez, Jesús Bernardoni, V. Pandolfi, Marco Alastuey, Andrés Querol, Xavier Ciniglia, Davide Močnik, G. Vecchi, R. |
author_sort |
Yus-Díez, Jesús |
title |
On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C |
title_short |
On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C |
title_full |
On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C |
title_fullStr |
On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C |
title_full_unstemmed |
On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C |
title_sort |
on the wavelength dependence of the ae33 aethalometer multiple scattering correction factor c |
publishDate |
2020-09 |
url |
http://hdl.handle.net/10261/217670 |
work_keys_str_mv |
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1777669448402993152 |