On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C

The Aethalometer (AE; Magee Scientific) is a widely used filter-based instrument that provides in-situ realtime optical measurements of light absorbing aerosols in 7 different wavelengths ranging from 370nm to 950nm. As for any other filter-based technique, Aethalometer measurements are affected by two artefacts: the multiple-scattering effects caused by the scattering of sampling light by both the filter fibres and the aerosol particles on the filter (C(l) in Eq. 1) and the loading effect due to the saturation of the measurement as a function of deposited particles (RATN(l) in Eq. 1).

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Bibliographic Details
Main Authors: Yus-Díez, Jesús, Bernardoni, V., Pandolfi, Marco, Alastuey, Andrés, Querol, Xavier, Ciniglia, Davide, Močnik, G., Vecchi, R.
Other Authors: Pandolfi, Marco [0000-0002-7493-7213]
Format: comunicación de congreso biblioteca
Language:English
Published: 2020-09
Subjects:Aerosols, Aethalometer,
Online Access:http://hdl.handle.net/10261/217670
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spelling dig-idaea-es-10261-2176702022-02-04T09:01:51Z On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C Yus-Díez, Jesús Bernardoni, V. Pandolfi, Marco Alastuey, Andrés Querol, Xavier Ciniglia, Davide Močnik, G. Vecchi, R. Pandolfi, Marco [0000-0002-7493-7213] Alastuey, Andrés [0000-0002-5453-5495] Querol, Xavier [0000-0002-6549-9899] Aerosols Aethalometer The Aethalometer (AE; Magee Scientific) is a widely used filter-based instrument that provides in-situ realtime optical measurements of light absorbing aerosols in 7 different wavelengths ranging from 370nm to 950nm. As for any other filter-based technique, Aethalometer measurements are affected by two artefacts: the multiple-scattering effects caused by the scattering of sampling light by both the filter fibres and the aerosol particles on the filter (C(l) in Eq. 1) and the loading effect due to the saturation of the measurement as a function of deposited particles (RATN(l) in Eq. 1). This work was supported by Generalitat de Catalunya (SGR41), FEDER funds under the project HOUSE (CGL2016-78594-R), COST action COLOSSAL (CA16109). Peer reviewed 2020-08-10T10:20:03Z 2020-08-10T10:20:03Z 2020-09 comunicación de congreso http://purl.org/coar/resource_type/c_5794 European Aerosol Conference (EAC) 2020 http://hdl.handle.net/10261/217670 en Sí open
institution IDAEA ES
collection DSpace
country España
countrycode ES
component Bibliográfico
access En linea
databasecode dig-idaea-es
tag biblioteca
region Europa del Sur
libraryname Biblioteca del IDAEA España
language English
topic Aerosols
Aethalometer
Aerosols
Aethalometer
spellingShingle Aerosols
Aethalometer
Aerosols
Aethalometer
Yus-Díez, Jesús
Bernardoni, V.
Pandolfi, Marco
Alastuey, Andrés
Querol, Xavier
Ciniglia, Davide
Močnik, G.
Vecchi, R.
On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
description The Aethalometer (AE; Magee Scientific) is a widely used filter-based instrument that provides in-situ realtime optical measurements of light absorbing aerosols in 7 different wavelengths ranging from 370nm to 950nm. As for any other filter-based technique, Aethalometer measurements are affected by two artefacts: the multiple-scattering effects caused by the scattering of sampling light by both the filter fibres and the aerosol particles on the filter (C(l) in Eq. 1) and the loading effect due to the saturation of the measurement as a function of deposited particles (RATN(l) in Eq. 1).
author2 Pandolfi, Marco [0000-0002-7493-7213]
author_facet Pandolfi, Marco [0000-0002-7493-7213]
Yus-Díez, Jesús
Bernardoni, V.
Pandolfi, Marco
Alastuey, Andrés
Querol, Xavier
Ciniglia, Davide
Močnik, G.
Vecchi, R.
format comunicación de congreso
topic_facet Aerosols
Aethalometer
author Yus-Díez, Jesús
Bernardoni, V.
Pandolfi, Marco
Alastuey, Andrés
Querol, Xavier
Ciniglia, Davide
Močnik, G.
Vecchi, R.
author_sort Yus-Díez, Jesús
title On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
title_short On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
title_full On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
title_fullStr On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
title_full_unstemmed On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
title_sort on the wavelength dependence of the ae33 aethalometer multiple scattering correction factor c
publishDate 2020-09
url http://hdl.handle.net/10261/217670
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