Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films
We describe a low-energy electron impact experiment, performed on thin n-hexane films held at 80 K, that was designed for the measurement of the effective dissociation cross section in the energy range 0.5-31 eV. The onset of dissociation was found at =~3,6 eV incident electron energy, implicating the excitation of a low-lying triplet state. High dissociation rates at electron energies close to the ionization threshold were correlated to dissociative excited singlet and superexcited states.
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dig-cirad-fr-5613462024-01-28T19:33:22Z http://agritrop.cirad.fr/561346/ http://agritrop.cirad.fr/561346/ Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films. Leclerc Grégoire, Cui Zuolin, Sanche Léon. 1987. Journal of Physical Chemistry, 91 (26) : 6461-6463. Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films Leclerc, Grégoire Cui, Zuolin Sanche, Léon eng 1987 Journal of Physical Chemistry U30 - Méthodes de recherche mesure (activité) radiation film http://aims.fao.org/aos/agrovoc/c_4668 http://aims.fao.org/aos/agrovoc/c_6422 http://aims.fao.org/aos/agrovoc/c_2899 We describe a low-energy electron impact experiment, performed on thin n-hexane films held at 80 K, that was designed for the measurement of the effective dissociation cross section in the energy range 0.5-31 eV. The onset of dissociation was found at =~3,6 eV incident electron energy, implicating the excitation of a low-lying triplet state. High dissociation rates at electron energies close to the ionization threshold were correlated to dissociative excited singlet and superexcited states. article info:eu-repo/semantics/article Journal Article info:eu-repo/semantics/publishedVersion http://agritrop.cirad.fr/561346/1/document_561346.pdf application/pdf Cirad license info:eu-repo/semantics/restrictedAccess https://agritrop.cirad.fr/mention_legale.html |
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U30 - Méthodes de recherche mesure (activité) radiation film http://aims.fao.org/aos/agrovoc/c_4668 http://aims.fao.org/aos/agrovoc/c_6422 http://aims.fao.org/aos/agrovoc/c_2899 U30 - Méthodes de recherche mesure (activité) radiation film http://aims.fao.org/aos/agrovoc/c_4668 http://aims.fao.org/aos/agrovoc/c_6422 http://aims.fao.org/aos/agrovoc/c_2899 |
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U30 - Méthodes de recherche mesure (activité) radiation film http://aims.fao.org/aos/agrovoc/c_4668 http://aims.fao.org/aos/agrovoc/c_6422 http://aims.fao.org/aos/agrovoc/c_2899 U30 - Méthodes de recherche mesure (activité) radiation film http://aims.fao.org/aos/agrovoc/c_4668 http://aims.fao.org/aos/agrovoc/c_6422 http://aims.fao.org/aos/agrovoc/c_2899 Leclerc, Grégoire Cui, Zuolin Sanche, Léon Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films |
| description |
We describe a low-energy electron impact experiment, performed on thin n-hexane films held at 80 K, that was designed for the measurement of the effective dissociation cross section in the energy range 0.5-31 eV. The onset of dissociation was found at =~3,6 eV incident electron energy, implicating the excitation of a low-lying triplet state. High dissociation rates at electron energies close to the ionization threshold were correlated to dissociative excited singlet and superexcited states. |
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article |
| topic_facet |
U30 - Méthodes de recherche mesure (activité) radiation film http://aims.fao.org/aos/agrovoc/c_4668 http://aims.fao.org/aos/agrovoc/c_6422 http://aims.fao.org/aos/agrovoc/c_2899 |
| author |
Leclerc, Grégoire Cui, Zuolin Sanche, Léon |
| author_facet |
Leclerc, Grégoire Cui, Zuolin Sanche, Léon |
| author_sort |
Leclerc, Grégoire |
| title |
Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films |
| title_short |
Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films |
| title_full |
Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films |
| title_fullStr |
Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films |
| title_full_unstemmed |
Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films |
| title_sort |
effective dissociation cross section for the low-energy (0.5-31 ev) electron impact on solid hexane thin films |
| url |
http://agritrop.cirad.fr/561346/ http://agritrop.cirad.fr/561346/1/document_561346.pdf |
| work_keys_str_mv |
AT leclercgregoire effectivedissociationcrosssectionforthelowenergy0531evelectronimpactonsolidhexanethinfilms AT cuizuolin effectivedissociationcrosssectionforthelowenergy0531evelectronimpactonsolidhexanethinfilms AT sancheleon effectivedissociationcrosssectionforthelowenergy0531evelectronimpactonsolidhexanethinfilms |
| _version_ |
1792497920696647680 |