Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films
We describe a low-energy electron impact experiment, performed on thin n-hexane films held at 80 K, that was designed for the measurement of the effective dissociation cross section in the energy range 0.5-31 eV. The onset of dissociation was found at =~3,6 eV incident electron energy, implicating the excitation of a low-lying triplet state. High dissociation rates at electron energies close to the ionization threshold were correlated to dissociative excited singlet and superexcited states.
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | article biblioteca |
| Language: | eng |
| Subjects: | U30 - Méthodes de recherche, mesure (activité), radiation, film, http://aims.fao.org/aos/agrovoc/c_4668, http://aims.fao.org/aos/agrovoc/c_6422, http://aims.fao.org/aos/agrovoc/c_2899, |
| Online Access: | http://agritrop.cirad.fr/561346/ http://agritrop.cirad.fr/561346/1/document_561346.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | We describe a low-energy electron impact experiment, performed on thin n-hexane films held at 80 K, that was designed for the measurement of the effective dissociation cross section in the energy range 0.5-31 eV. The onset of dissociation was found at =~3,6 eV incident electron energy, implicating the excitation of a low-lying triplet state. High dissociation rates at electron energies close to the ionization threshold were correlated to dissociative excited singlet and superexcited states. |
|---|