Progress in disease resistance and yield potential: an analysis of VEF - EP Nurseries (1979 - 1986)

Using the data generated by VEF (vivero equipo de frijol) and EP (ensayo preliminar de rendimiento) nurseries during 1979-86, the progress of the CIAT Bean Program during this 8-yr period of plant breeding effort is described in terms of the production of disease resistant lines and the attainment of high-yield-potential lines with disease resistance attributes. The analysis of disease reaction evaluations of VEF-EP nurseries shows an increasing trend in the production of bean lines resistant to the 5 diseases considered (rust, anthracnose, angular leaf spot, common bacterial blight, and BCMV). There are enough sources of combined disease resistance to satisfy specific regional needs. Twenty-five percent of the 1257 lines tested at EP nurseries in the 3- yr period between 1984 and 1986 are high yield potential lines. (CIAT)

Bibliographic Details

Main Authors:	Amézquita, María Cristina, Voysest Voysest, Oswaldo
Format:	Conference Paper biblioteca
Language:	English
Published:	International Center for Tropical Agriculture 1987
Subjects:	phaseolus vulgaris, cultivars, adaptation, resistance, uromyces phaseoli, colletotrichum lindemuthianum, isariopsis griseola, xanthomonas campestris phaseoli, bean common mosaic virus, statistical analysis, bacterial diseases, diseases and pathogens, mycoses, pests, viroses, variedades, adaptación, resistencia, virus del mosaico común frijol, analisis estadistico,
Online Access:	https://hdl.handle.net/10568/69889 http://ciat-library.ciat.cgiar.org/Articulos_Ciat/Digital/33581_Progress_%20in%20_disease_%20resistance_%20and%20_yield_%20potential%20_an_%20analysis%20_of%20VEEP_Nurseries.pdf
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