Determination of the level of defective beans in coffee samples by using array of nanostructured sensors.
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Main Authors: | PATERNO, L. G., FONSECA, F. J., DELIZA, R., MATTOSO, L. H. C. |
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Format: | Separatas biblioteca |
Language: | English eng |
Published: |
2008-11-26
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Subjects: | Evento, |
Online Access: | http://www.alice.cnptia.embrapa.br/alice/handle/doc/26898 |
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