Microanalysis of Solids [electronic resource] /

The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi­ mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi­ croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro­ analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad­ uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid­ state sciences.

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Bibliographic Details
Main Authors: Yacobi, B. G. editor., Holt, D. B. editor., Kazmerski, L. L. editor., SpringerLink (Online service)
Format: Texto biblioteca
Language:eng
Published: Boston, MA : Springer US : Imprint: Springer, 1994
Subjects:Life sciences., Inorganic chemistry., Microscopy., Condensed matter., Solid state physics., Crystallography., Spectroscopy., Life Sciences., Biological Microscopy., Inorganic Chemistry., Solid State Physics., Spectroscopy and Microscopy., Condensed Matter Physics.,
Online Access:http://dx.doi.org/10.1007/978-1-4899-1492-7
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id KOHA-OAI-TEST:221175
record_format koha
institution COLPOS
collection Koha
country México
countrycode MX
component Bibliográfico
access En linea
En linea
databasecode cat-colpos
tag biblioteca
region America del Norte
libraryname Departamento de documentación y biblioteca de COLPOS
language eng
topic Life sciences.
Inorganic chemistry.
Microscopy.
Condensed matter.
Solid state physics.
Crystallography.
Spectroscopy.
Life Sciences.
Biological Microscopy.
Inorganic Chemistry.
Solid State Physics.
Spectroscopy and Microscopy.
Condensed Matter Physics.
Crystallography.
Life sciences.
Inorganic chemistry.
Microscopy.
Condensed matter.
Solid state physics.
Crystallography.
Spectroscopy.
Life Sciences.
Biological Microscopy.
Inorganic Chemistry.
Solid State Physics.
Spectroscopy and Microscopy.
Condensed Matter Physics.
Crystallography.
spellingShingle Life sciences.
Inorganic chemistry.
Microscopy.
Condensed matter.
Solid state physics.
Crystallography.
Spectroscopy.
Life Sciences.
Biological Microscopy.
Inorganic Chemistry.
Solid State Physics.
Spectroscopy and Microscopy.
Condensed Matter Physics.
Crystallography.
Life sciences.
Inorganic chemistry.
Microscopy.
Condensed matter.
Solid state physics.
Crystallography.
Spectroscopy.
Life Sciences.
Biological Microscopy.
Inorganic Chemistry.
Solid State Physics.
Spectroscopy and Microscopy.
Condensed Matter Physics.
Crystallography.
Yacobi, B. G. editor.
Holt, D. B. editor.
Kazmerski, L. L. editor.
SpringerLink (Online service)
Microanalysis of Solids [electronic resource] /
description The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi­ mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi­ croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro­ analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad­ uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid­ state sciences.
format Texto
topic_facet Life sciences.
Inorganic chemistry.
Microscopy.
Condensed matter.
Solid state physics.
Crystallography.
Spectroscopy.
Life Sciences.
Biological Microscopy.
Inorganic Chemistry.
Solid State Physics.
Spectroscopy and Microscopy.
Condensed Matter Physics.
Crystallography.
author Yacobi, B. G. editor.
Holt, D. B. editor.
Kazmerski, L. L. editor.
SpringerLink (Online service)
author_facet Yacobi, B. G. editor.
Holt, D. B. editor.
Kazmerski, L. L. editor.
SpringerLink (Online service)
author_sort Yacobi, B. G. editor.
title Microanalysis of Solids [electronic resource] /
title_short Microanalysis of Solids [electronic resource] /
title_full Microanalysis of Solids [electronic resource] /
title_fullStr Microanalysis of Solids [electronic resource] /
title_full_unstemmed Microanalysis of Solids [electronic resource] /
title_sort microanalysis of solids [electronic resource] /
publisher Boston, MA : Springer US : Imprint: Springer,
publishDate 1994
url http://dx.doi.org/10.1007/978-1-4899-1492-7
work_keys_str_mv AT yacobibgeditor microanalysisofsolidselectronicresource
AT holtdbeditor microanalysisofsolidselectronicresource
AT kazmerskilleditor microanalysisofsolidselectronicresource
AT springerlinkonlineservice microanalysisofsolidselectronicresource
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spelling KOHA-OAI-TEST:2211752018-07-30T23:59:11ZMicroanalysis of Solids [electronic resource] / Yacobi, B. G. editor. Holt, D. B. editor. Kazmerski, L. L. editor. SpringerLink (Online service) textBoston, MA : Springer US : Imprint: Springer,1994.engThe main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi­ mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi­ croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro­ analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad­ uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid­ state sciences.I. Introduction -- 1. An Introduction to Microanalysis of Solids -- II. Electron Beam Techniques -- 2. Scanning Electron Microscopy -- 3. Transmission Electron Microscopy -- 4. Auger Electron Spectroscopy -- III. Ion Beam Techniques -- 5. Secondary Ion Mass Spectrometry -- 6. Applications of Megaelectron-Volt Ion Beams in Materials Analysis -- IV. Photon Beam Techniques -- 7. Confocal Microscopy -- 8. X-ray Microscopy -- 9. X-ray Photoemission Spectroscopy -- 10. Laser Ionization Mass Spectrometry -- 11. Microellipsometry -- V. Acoustic Wave Excitation -- 12. Scanning Acoustic Microscopy -- VI. Tunneling of Electrons and Scanning Probe Microscopies -- 13. Field Emission, Field Ion Microscopy, and the Atom Probe -- 14. Scanning Probe Microscopy.The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi­ mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi­ croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro­ analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad­ uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid­ state sciences.Life sciences.Inorganic chemistry.Microscopy.Condensed matter.Solid state physics.Crystallography.Spectroscopy.Life Sciences.Biological Microscopy.Inorganic Chemistry.Solid State Physics.Spectroscopy and Microscopy.Condensed Matter Physics.Crystallography.Springer eBookshttp://dx.doi.org/10.1007/978-1-4899-1492-7URN:ISBN:9781489914927