Electrothermal Analysis of VLSI Systems [electronic resource] /

Electrothermal Analysis of VLSI Systems [electronic resource] /

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Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.

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Bibliographic Details
Main Authors: Cheng, Yi-Kan. author., Tsai, Ching-Han. author., Teng, Chin-Chi. author., Kang, Sung-Mo Steve. author., SpringerLink (Online service)
Format: Texto biblioteca
Language:eng
Published: Boston, MA : Springer US, 2002
Subjects:Engineering., Electrical engineering., Electronic circuits., Circuits and Systems., Electrical Engineering.,
Online Access:http://dx.doi.org/10.1007/b117332
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id KOHA-OAI-TEST:208893
record_format koha
spelling KOHA-OAI-TEST:2088932018-07-30T23:40:01ZElectrothermal Analysis of VLSI Systems [electronic resource] / Cheng, Yi-Kan. author. Tsai, Ching-Han. author. Teng, Chin-Chi. author. Kang, Sung-Mo Steve. author. SpringerLink (Online service) textBoston, MA : Springer US,2002.engElectrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.The Building Blocks -- Power Analysis for CMOS Circuits -- Temperature-dependent MOS Device Modeling -- Thermal Simulation for VLSI Systems -- Fast-timing Electrothermal Simulation -- The Applications -- Temperature-dependent Electromigration Reliability -- Temperature-driven Cell Placement -- Temperature-driven Power and Timing Analysis.Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.Engineering.Electrical engineering.Electronic circuits.Engineering.Circuits and Systems.Electrical Engineering.Springer eBookshttp://dx.doi.org/10.1007/b117332URN:ISBN:9780306470240
institution COLPOS
collection Koha
country México
countrycode MX
component Bibliográfico
access En linea
En linea
databasecode cat-colpos
tag biblioteca
region America del Norte
libraryname Departamento de documentación y biblioteca de COLPOS
language eng
topic Engineering.
Electrical engineering.
Electronic circuits.
Engineering.
Circuits and Systems.
Electrical Engineering.
Engineering.
Electrical engineering.
Electronic circuits.
Engineering.
Circuits and Systems.
Electrical Engineering.
spellingShingle Engineering.
Electrical engineering.
Electronic circuits.
Engineering.
Circuits and Systems.
Electrical Engineering.
Engineering.
Electrical engineering.
Electronic circuits.
Engineering.
Circuits and Systems.
Electrical Engineering.
Cheng, Yi-Kan. author.
Tsai, Ching-Han. author.
Teng, Chin-Chi. author.
Kang, Sung-Mo Steve. author.
SpringerLink (Online service)
Electrothermal Analysis of VLSI Systems [electronic resource] /
description Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
format Texto
topic_facet Engineering.
Electrical engineering.
Electronic circuits.
Engineering.
Circuits and Systems.
Electrical Engineering.
author Cheng, Yi-Kan. author.
Tsai, Ching-Han. author.
Teng, Chin-Chi. author.
Kang, Sung-Mo Steve. author.
SpringerLink (Online service)
author_facet Cheng, Yi-Kan. author.
Tsai, Ching-Han. author.
Teng, Chin-Chi. author.
Kang, Sung-Mo Steve. author.
SpringerLink (Online service)
author_sort Cheng, Yi-Kan. author.
title Electrothermal Analysis of VLSI Systems [electronic resource] /
title_short Electrothermal Analysis of VLSI Systems [electronic resource] /
title_full Electrothermal Analysis of VLSI Systems [electronic resource] /
title_fullStr Electrothermal Analysis of VLSI Systems [electronic resource] /
title_full_unstemmed Electrothermal Analysis of VLSI Systems [electronic resource] /
title_sort electrothermal analysis of vlsi systems [electronic resource] /
publisher Boston, MA : Springer US,
publishDate 2002
url http://dx.doi.org/10.1007/b117332
work_keys_str_mv AT chengyikanauthor electrothermalanalysisofvlsisystemselectronicresource
AT tsaichinghanauthor electrothermalanalysisofvlsisystemselectronicresource
AT tengchinchiauthor electrothermalanalysisofvlsisystemselectronicresource
AT kangsungmosteveauthor electrothermalanalysisofvlsisystemselectronicresource
AT springerlinkonlineservice electrothermalanalysisofvlsisystemselectronicresource
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