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Optical Properties of Low Dimensional Silicon Structures [electronic resource] /
The workshop on "Optical Properties of Low Dimensional Silicon sL Structures" was held in Meylan, France on March, I yd, 1993. The workshop took place inside the facilities of France Telecom- CNET. Around 45 leading scientists working on this rapidly moving field were in attendance. Principal support was provided by the Advanced Research Workshop Program of the North Atlantic Treaty Organisation (NATO). French Delegation a l'Armement and CNET gave also a small financial grant, the organisational part being undertaken by the SEE and CNET. There is currently intense research activity worldwide devoted to the optical properties of low dimensional silicon structures. This follow the recent discovery of efficient visible photoluminescence (PL) from highly porous silicon. This workshop was intended to bring together all the leading European scientists and laboratories in order to reveal the state of the art and to open new research fields on this subject. A large number of invited talks took place (12) together with regular contribution (20). The speakers were asked to leave nearly 1/3 of the time to the discussion with the audience, and that promoted both formal and informal discussions between the participants.
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| Main Authors: | , , , |
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| Format: | Texto biblioteca |
| Language: | eng |
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Dordrecht : Springer Netherlands : Imprint: Springer,
1993
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| Subjects: | Physics., Geotechnical engineering., Condensed matter., Solid state physics., Spectroscopy., Microscopy., Optical materials., Electronic materials., Materials science., Condensed Matter Physics., Solid State Physics., Spectroscopy and Microscopy., Optical and Electronic Materials., Characterization and Evaluation of Materials., Geotechnical Engineering & Applied Earth Sciences., |
| Online Access: | http://dx.doi.org/10.1007/978-94-011-2092-0 |
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KOHA-OAI-TEST:198688 |
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koha |
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COLPOS |
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Koha |
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México |
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MX |
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Bibliográfico |
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biblioteca |
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America del Norte |
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Departamento de documentación y biblioteca de COLPOS |
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eng |
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Physics. Geotechnical engineering. Condensed matter. Solid state physics. Spectroscopy. Microscopy. Optical materials. Electronic materials. Materials science. Physics. Condensed Matter Physics. Solid State Physics. Spectroscopy and Microscopy. Optical and Electronic Materials. Characterization and Evaluation of Materials. Geotechnical Engineering & Applied Earth Sciences. Physics. Geotechnical engineering. Condensed matter. Solid state physics. Spectroscopy. Microscopy. Optical materials. Electronic materials. Materials science. Physics. Condensed Matter Physics. Solid State Physics. Spectroscopy and Microscopy. Optical and Electronic Materials. Characterization and Evaluation of Materials. Geotechnical Engineering & Applied Earth Sciences. |
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Physics. Geotechnical engineering. Condensed matter. Solid state physics. Spectroscopy. Microscopy. Optical materials. Electronic materials. Materials science. Physics. Condensed Matter Physics. Solid State Physics. Spectroscopy and Microscopy. Optical and Electronic Materials. Characterization and Evaluation of Materials. Geotechnical Engineering & Applied Earth Sciences. Physics. Geotechnical engineering. Condensed matter. Solid state physics. Spectroscopy. Microscopy. Optical materials. Electronic materials. Materials science. Physics. Condensed Matter Physics. Solid State Physics. Spectroscopy and Microscopy. Optical and Electronic Materials. Characterization and Evaluation of Materials. Geotechnical Engineering & Applied Earth Sciences. Bensahel, Daniel C. editor. Canham, Leigh T. editor. Ossicini, Stephano. editor. SpringerLink (Online service) Optical Properties of Low Dimensional Silicon Structures [electronic resource] / |
| description |
The workshop on "Optical Properties of Low Dimensional Silicon sL Structures" was held in Meylan, France on March, I yd, 1993. The workshop took place inside the facilities of France Telecom- CNET. Around 45 leading scientists working on this rapidly moving field were in attendance. Principal support was provided by the Advanced Research Workshop Program of the North Atlantic Treaty Organisation (NATO). French Delegation a l'Armement and CNET gave also a small financial grant, the organisational part being undertaken by the SEE and CNET. There is currently intense research activity worldwide devoted to the optical properties of low dimensional silicon structures. This follow the recent discovery of efficient visible photoluminescence (PL) from highly porous silicon. This workshop was intended to bring together all the leading European scientists and laboratories in order to reveal the state of the art and to open new research fields on this subject. A large number of invited talks took place (12) together with regular contribution (20). The speakers were asked to leave nearly 1/3 of the time to the discussion with the audience, and that promoted both formal and informal discussions between the participants. |
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Texto |
| topic_facet |
Physics. Geotechnical engineering. Condensed matter. Solid state physics. Spectroscopy. Microscopy. Optical materials. Electronic materials. Materials science. Physics. Condensed Matter Physics. Solid State Physics. Spectroscopy and Microscopy. Optical and Electronic Materials. Characterization and Evaluation of Materials. Geotechnical Engineering & Applied Earth Sciences. |
| author |
Bensahel, Daniel C. editor. Canham, Leigh T. editor. Ossicini, Stephano. editor. SpringerLink (Online service) |
| author_facet |
Bensahel, Daniel C. editor. Canham, Leigh T. editor. Ossicini, Stephano. editor. SpringerLink (Online service) |
| author_sort |
Bensahel, Daniel C. editor. |
| title |
Optical Properties of Low Dimensional Silicon Structures [electronic resource] / |
| title_short |
Optical Properties of Low Dimensional Silicon Structures [electronic resource] / |
| title_full |
Optical Properties of Low Dimensional Silicon Structures [electronic resource] / |
| title_fullStr |
Optical Properties of Low Dimensional Silicon Structures [electronic resource] / |
| title_full_unstemmed |
Optical Properties of Low Dimensional Silicon Structures [electronic resource] / |
| title_sort |
optical properties of low dimensional silicon structures [electronic resource] / |
| publisher |
Dordrecht : Springer Netherlands : Imprint: Springer, |
| publishDate |
1993 |
| url |
http://dx.doi.org/10.1007/978-94-011-2092-0 |
| work_keys_str_mv |
AT bensaheldanielceditor opticalpropertiesoflowdimensionalsiliconstructureselectronicresource AT canhamleighteditor opticalpropertiesoflowdimensionalsiliconstructureselectronicresource AT ossicinistephanoeditor opticalpropertiesoflowdimensionalsiliconstructureselectronicresource AT springerlinkonlineservice opticalpropertiesoflowdimensionalsiliconstructureselectronicresource |
| _version_ |
1756267188595982336 |
| spelling |
KOHA-OAI-TEST:1986882018-07-30T23:25:15ZOptical Properties of Low Dimensional Silicon Structures [electronic resource] / Bensahel, Daniel C. editor. Canham, Leigh T. editor. Ossicini, Stephano. editor. SpringerLink (Online service) textDordrecht : Springer Netherlands : Imprint: Springer,1993.engThe workshop on "Optical Properties of Low Dimensional Silicon sL Structures" was held in Meylan, France on March, I yd, 1993. The workshop took place inside the facilities of France Telecom- CNET. Around 45 leading scientists working on this rapidly moving field were in attendance. Principal support was provided by the Advanced Research Workshop Program of the North Atlantic Treaty Organisation (NATO). French Delegation a l'Armement and CNET gave also a small financial grant, the organisational part being undertaken by the SEE and CNET. There is currently intense research activity worldwide devoted to the optical properties of low dimensional silicon structures. This follow the recent discovery of efficient visible photoluminescence (PL) from highly porous silicon. This workshop was intended to bring together all the leading European scientists and laboratories in order to reveal the state of the art and to open new research fields on this subject. A large number of invited talks took place (12) together with regular contribution (20). The speakers were asked to leave nearly 1/3 of the time to the discussion with the audience, and that promoted both formal and informal discussions between the participants.“Microporous silicon: Formation mechanism and preparation method” -- “Electrochemical and chemical behavior of porous silicon layers: the role of the material wettability and its high specific surface area” -- “Fabrication of silicon nanostructures for light emission study” -- “Light emission from porous silicon and other self organised low dimensional systems” -- “Preparation and properties of thin siloxene films on silicon” -- “Modelling of porous structures formation during electrochemical treatment of materials” -- “Electronic charge trapping effects in porous silicon” -- “Mechanical, optical and electrical properties of porous silicon prepared under clean conditions” -- “The influence of microelectronic processing steps on the properties of porous silicon layers” -- “Progress towards understanding and exploiting the luminescent properties of highly porous silicon” -- ““White”photoluminescence from electrochemically attacked silicon” -- “Electrochemical investigation of the electroluminescent properties of porous silicon” -- “Phenomenological properties of the fast (blue) and slow (red) components in the photoluminescence of porous silicon” -- “Electroluminescence from porous silicon” -- “Optoelectronic properties of porous silicon” -- “Voltage Tunable electroluminescence of porous silicon” -- “Studies of porous silicon by Electron Microscopy” -- “Scanning probe microscopies of luminescent porous silicon layers” -- “In-situ combined infrared and photoluminescence investigation of porous silicon during its etching” -- “Near surface states in Si and their possible role in the luminescence of porous silicon” -- “Porous silicon electroluminescence mechanisms and defect analysis” -- “Defect and structure analysis of n+ and p+-type porous silicon by the Electron Paramagnetic Resonance technique” -- “Photoluminescence and optically detected magnetic resonance investigations on porous silicon” -- “Effects of the reduction of dielectric constant in nanoscale silicon” -- “Quantum effects in porous-Si ?” -- “Electronic properties of low dimensional silicon structures” -- “Role of silicon molecules and crystallites in the luminescence of porous silicon” -- “Localisation of excitons on a quantum wire of fluctuating width”.The workshop on "Optical Properties of Low Dimensional Silicon sL Structures" was held in Meylan, France on March, I yd, 1993. The workshop took place inside the facilities of France Telecom- CNET. Around 45 leading scientists working on this rapidly moving field were in attendance. Principal support was provided by the Advanced Research Workshop Program of the North Atlantic Treaty Organisation (NATO). French Delegation a l'Armement and CNET gave also a small financial grant, the organisational part being undertaken by the SEE and CNET. There is currently intense research activity worldwide devoted to the optical properties of low dimensional silicon structures. This follow the recent discovery of efficient visible photoluminescence (PL) from highly porous silicon. This workshop was intended to bring together all the leading European scientists and laboratories in order to reveal the state of the art and to open new research fields on this subject. A large number of invited talks took place (12) together with regular contribution (20). The speakers were asked to leave nearly 1/3 of the time to the discussion with the audience, and that promoted both formal and informal discussions between the participants.Physics.Geotechnical engineering.Condensed matter.Solid state physics.Spectroscopy.Microscopy.Optical materials.Electronic materials.Materials science.Physics.Condensed Matter Physics.Solid State Physics.Spectroscopy and Microscopy.Optical and Electronic Materials.Characterization and Evaluation of Materials.Geotechnical Engineering & Applied Earth Sciences.Springer eBookshttp://dx.doi.org/10.1007/978-94-011-2092-0URN:ISBN:9789401120920 |