Content-Based Access to Multimedia Information [electronic resource] : From Technology Trends to State of the Art /

In the past five years, the field of electrostatic discharge (ESD) control has under­ gone some notable changes. Industry standards have multiplied, though not all of these, in our view, are realistic and meaningful. Increasing importance has been ascribed to the Charged Device Model (CDM) versus the Human Body Model (HBM) as a cause of device damage and, presumably, premature (latent) failure. Packaging materials have significantly evolved. Air ionization techniques have improved, and usage has grown. Finally, and importantly, the government has ceased imposing MIL-STD-1686 on all new contracts, leaving companies on their own to formulate an ESD-control policy and write implementing documents. All these changes are dealt with in five new chapters and ten new reprinted papers added to this revised edition of ESD from A to Z. Also, the original chapters have been augmented with new material such as more troubleshooting examples in Chapter 8 and a 20-question multiple-choice test for certifying operators in Chapter 9. More than ever, the book seeks to provide advice, guidance, and practical ex­ amples, not just a jumble of facts and generalizations. For instance, the added tailored versions of the model specifications for ESD-safe handling and packaging are actually in use at medium-sized corporations and could serve as patterns for many readers.

Bibliographic Details

Main Authors:	Perry, Brad. author., Dinsmore, John. author., Chang, Shi-Kuo. author., Doermann, David. author., Rosenfeld, Azriel. author., Stevens, Scott. author., SpringerLink (Online service)
Format:	Texto biblioteca
Language:	eng
Published:	Boston, MA : Springer US : Imprint: Springer, 1999
Subjects:	Computer science., Microprocessors., Data structures (Computer science)., Information storage and retrieval., Computer Science., Data Structures, Cryptology and Information Theory., Processor Architectures., Information Storage and Retrieval.,
Online Access:	http://dx.doi.org/10.1007/978-1-4615-5035-8
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