Sample holder for x-ray microanalysis using scanning electron microscopy
[EN] The invention relates to a novel sample holder (1) for X-ray microanalysis, which prevents interference between the signals from the sample and the signals from the sample holder (1) and which incIudes a base (2) bearing columns (3a, 3b, 3c) that support a bearing structure (4), preferablya cylinder with an upper lid (5) provided with a central opening (6), on which a grating containing the sample is placed.
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| Main Authors: | , |
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| Format: | solicitud de patente biblioteca |
| Language: | English |
| Published: |
2010-07-01
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| Online Access: | http://hdl.handle.net/10261/32284 |
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