X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /

X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /

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This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

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Bibliographic Details
Main Authors: Authier, André. editor., Lagomarsino, Stefano. editor., Tanner, Brian K. editor., SpringerLink (Online service)
Format: Texto biblioteca
Language:eng
Published: Boston, MA : Springer US : Imprint: Springer, 1996
Subjects:Physics., Solid state physics., Spectroscopy., Microscopy., Materials science., Solid State Physics., Spectroscopy and Microscopy., Characterization and Evaluation of Materials.,
Online Access:http://dx.doi.org/10.1007/978-1-4615-5879-8
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record_format koha
institution COLPOS
collection Koha
country México
countrycode MX
component Bibliográfico
access En linea
En linea
databasecode cat-colpos
tag biblioteca
region America del Norte
libraryname Departamento de documentación y biblioteca de COLPOS
language eng
topic Physics.
Solid state physics.
Spectroscopy.
Microscopy.
Materials science.
Physics.
Solid State Physics.
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Physics.
Solid state physics.
Spectroscopy.
Microscopy.
Materials science.
Physics.
Solid State Physics.
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
spellingShingle Physics.
Solid state physics.
Spectroscopy.
Microscopy.
Materials science.
Physics.
Solid State Physics.
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Physics.
Solid state physics.
Spectroscopy.
Microscopy.
Materials science.
Physics.
Solid State Physics.
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Authier, André. editor.
Lagomarsino, Stefano. editor.
Tanner, Brian K. editor.
SpringerLink (Online service)
X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /
description This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
format Texto
topic_facet Physics.
Solid state physics.
Spectroscopy.
Microscopy.
Materials science.
Physics.
Solid State Physics.
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
author Authier, André. editor.
Lagomarsino, Stefano. editor.
Tanner, Brian K. editor.
SpringerLink (Online service)
author_facet Authier, André. editor.
Lagomarsino, Stefano. editor.
Tanner, Brian K. editor.
SpringerLink (Online service)
author_sort Authier, André. editor.
title X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /
title_short X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /
title_full X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /
title_fullStr X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /
title_full_unstemmed X-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications /
title_sort x-ray and neutron dynamical diffraction [electronic resource] : theory and applications /
publisher Boston, MA : Springer US : Imprint: Springer,
publishDate 1996
url http://dx.doi.org/10.1007/978-1-4615-5879-8
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AT tannerbriankeditor xrayandneutrondynamicaldiffractionelectronicresourcetheoryandapplications
AT springerlinkonlineservice xrayandneutrondynamicaldiffractionelectronicresourcetheoryandapplications
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spelling KOHA-OAI-TEST:2116562018-07-30T23:44:26ZX-Ray and Neutron Dynamical Diffraction [electronic resource] : Theory and Applications / Authier, André. editor. Lagomarsino, Stefano. editor. Tanner, Brian K. editor. SpringerLink (Online service) textBoston, MA : Springer US : Imprint: Springer,1996.engThis volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.Dynamical Theory of X-ray Diffraction - I. Perfect Crystals -- Dynamical Theory of Highly Asymmetric X-ray Diffraction -- Dynamical Theory of X-ray Diffraction - II. Deformed Crystals -- Dynamical Theory of Neutron Scattering -- X-ray Optical Beamline Design Principles -- X-ray Polarization and Applications -- Statistical Theory of Dynamical Diffraction in Crystals -- X-ray Diffraction Topography: Principles and Techniques -- Contrast of Defects in X-ray Diffraction Topographs -- X-ray Diffraction Topography: Application to Crystal Growth and Plastic Deformation -- Neutron Topography -- Application of Diffraction Topography to the Study of Magnetic Domains and Phase Transitions -- New Possibilities of Diffraction Topography at Third Generation Synchrotron Radiation Facilities -- X-ray Standing Waves -- X-ray Standing Wave Studies of Bulk Crystals, Thin Films and Interfaces -- X-ray Standing Waves: Thermal Vibration Amplitudes at Surfaces -- Long Period X-ray Standing Waves -- Theoretical Description of Multiple Crystal Arrangements -- Reciprocal Space Mapping -- Superlattices -- Characterization of Lattice Defects in Ion-implanted Silicon -- Multiple Bragg Scattering and the Phase Problem in X-ray Diffraction: Perfect Crystals -- Multiple Bragg Scattering and the Phase Problem in X-ray Diffraction: Mosaic Crystals -- Determination of Reflection Phases by Three-beam Diffraction -- X-ray and Neutron Interferometry: Basic Principles and Applications -- Applications of X-ray Interferometry -- Contributors.This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.Physics.Solid state physics.Spectroscopy.Microscopy.Materials science.Physics.Solid State Physics.Spectroscopy and Microscopy.Characterization and Evaluation of Materials.Springer eBookshttp://dx.doi.org/10.1007/978-1-4615-5879-8URN:ISBN:9781461558798

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