EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /

EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /

The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi­ cult to keep up with the literature. EXAFS and XANES are becoming interdis­ ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab­ sorption Fine Structure) and its applications. The other topic of the con­ ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ­ ent parts on various types of materials: amorphous metals, glasses, solu­ tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob­ lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn­ chrotron radiation and laboratory EXAFS.

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Main Authors: Bianconi, Antonio. editor., Incoccia, Lucia. editor., Stipcich, Stanislao. editor., SpringerLink (Online service)
Format: Texto biblioteca
Language:eng
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1983
Subjects:Physics., Crystallography.,
Online Access:http://dx.doi.org/10.1007/978-3-642-50098-5
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spelling KOHA-OAI-TEST:1954162018-07-30T23:21:14ZEXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 / Bianconi, Antonio. editor. Incoccia, Lucia. editor. Stipcich, Stanislao. editor. SpringerLink (Online service) textBerlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,1983.engThe field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi­ cult to keep up with the literature. EXAFS and XANES are becoming interdis­ ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab­ sorption Fine Structure) and its applications. The other topic of the con­ ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ­ ent parts on various types of materials: amorphous metals, glasses, solu­ tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob­ lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn­ chrotron radiation and laboratory EXAFS.Historical Perspective of EXAFS and Near Edge Structure Spectroscopy -- I Theoretical Aspects of EXAFS and XANES -- II EXAFS Data Analysis -- III XANES -- IV Special Crystalline Systems -- V Liquids and Disordered Systems -- VI Catalysts -- VII Biological Systems -- VIII Related Techniques — Anomalous Scattering -- IX Related Techniques — Electron Energy Loss -- X Instrumentation -- Index of Contributors.The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi­ cult to keep up with the literature. EXAFS and XANES are becoming interdis­ ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab­ sorption Fine Structure) and its applications. The other topic of the con­ ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ­ ent parts on various types of materials: amorphous metals, glasses, solu­ tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob­ lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn­ chrotron radiation and laboratory EXAFS.Physics.Crystallography.Physics.Crystallography.Springer eBookshttp://dx.doi.org/10.1007/978-3-642-50098-5URN:ISBN:9783642500985
institution COLPOS
collection Koha
country México
countrycode MX
component Bibliográfico
access En linea
En linea
databasecode cat-colpos
tag biblioteca
region America del Norte
libraryname Departamento de documentación y biblioteca de COLPOS
language eng
topic Physics.
Crystallography.
Physics.
Crystallography.
Physics.
Crystallography.
Physics.
Crystallography.
spellingShingle Physics.
Crystallography.
Physics.
Crystallography.
Physics.
Crystallography.
Physics.
Crystallography.
Bianconi, Antonio. editor.
Incoccia, Lucia. editor.
Stipcich, Stanislao. editor.
SpringerLink (Online service)
EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /
description The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi­ cult to keep up with the literature. EXAFS and XANES are becoming interdis­ ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab­ sorption Fine Structure) and its applications. The other topic of the con­ ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ­ ent parts on various types of materials: amorphous metals, glasses, solu­ tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob­ lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn­ chrotron radiation and laboratory EXAFS.
format Texto
topic_facet Physics.
Crystallography.
Physics.
Crystallography.
author Bianconi, Antonio. editor.
Incoccia, Lucia. editor.
Stipcich, Stanislao. editor.
SpringerLink (Online service)
author_facet Bianconi, Antonio. editor.
Incoccia, Lucia. editor.
Stipcich, Stanislao. editor.
SpringerLink (Online service)
author_sort Bianconi, Antonio. editor.
title EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /
title_short EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /
title_full EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /
title_fullStr EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /
title_full_unstemmed EXAFS and Near Edge Structure [electronic resource] : Proceedings of the International Conference Frascati, Italy, September 13–17, 1982 /
title_sort exafs and near edge structure [electronic resource] : proceedings of the international conference frascati, italy, september 13–17, 1982 /
publisher Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,
publishDate 1983
url http://dx.doi.org/10.1007/978-3-642-50098-5
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AT stipcichstanislaoeditor exafsandnearedgestructureelectronicresourceproceedingsoftheinternationalconferencefrascatiitalyseptember13171982
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