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$Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques$

Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques

by Bonilla-Jaimes,John Deiver, Henao-Martínez,Jose Antonio, Mendoza-Luna,Carolina, Castellanos-Alarcón,Oscar Mauricio, Ríos-Reyes,Carlos Alberto
Published 2016

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